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High and low temperature test chamber dewing what should I do?

by:GESTER     2020-08-22
In the high and low temperature test box test, if the experiment reference chamber of the dew point temperature is low, the temperature of the condensation will be happening. So high and low temperature test chamber dewing what should I do? How should solve? Here let's go to see: a high and low temperature test chamber, condensation of reasons: 1, operation temperature exceeds 30 ℃, operation environment humidity above 60% RH. 2, environment humidity, from low to high, from low to high temperature. 3, a major shift from low to high temperature. Second, the high and low temperature test chamber condensation solution: 1, because Windows broken hot method is difficult to use, so in order to avoid condensation, Windows to Windows by test box side surface temperature ascend to test box above the dew point temperature of moist air, thus can be used in Windows by test chamber side surface heating membrane method to prevent dewing. 2, because of the high and low temperature test chamber each position within the large thermal conductivity, the temperature of the each position to follow at random, poor ability of gas temperature and its temperature increases more slowly than gas, cause condensation. Can first make a temperature test chamber, let each test chamber in smooth enough after elevated temperature environment humidity, can prevent dewing. 3, large thermal conductivity test chamber internal each position, the temperature is not very easy to cause gas and chamber internal temperature in each position, cause condensation. The interpretation of the above is the cause of the high and low temperature test chamber dewing and solution, hope can help you, if you want to learn more about information of high and low temperature test chamber, welcome to the online consulting service or call the company service hotline ( Website top right corner) For consultation, we will wholeheartedly provide high quality service for you! Tags: & nbsp  high and low temperature test chamber
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